MultiSpec® Pro II and FTM-ProVis are application software programs designed for process control.
MultiSpec® Pro II is ideal for all kinds of absorption, reflection, transmission, and emission measurements. Various expansions, called add-ons, allow you to tailor this application to your demands, including links to process environments. FTM-ProVis is a software for thin-film recording and analysis.
Trial licenses for all software products are available upon request.
tec5 software products are offered for all current windows platforms. Support for other operating systems is possible upon request.
Please contact us for more details.
MultiSpec® Pro II Basic
Software for spectral data acquisition, graphical display, data storage, and data output
- Display of intensity, absorption, transmission, and dark current spectra
- Exports spectral data to JCAMP and ASCII formats
- Upgradeable to MultiSpec Pro II Standard or Process Packages
MultiSpec® Pro II Standard
Software for spectral data acquisition, graphical display, data storage, and data output
- Contains all MultiSpec Pro II Basic features
- Administration of displays and data processing in a workspace environment
- Flexible setting of result values - includes mathematical parser for calculations of results
- Add-on modules for chemometrics, color calculation, data preprocessing, multi-channel operation, and peak detection
MultiSpec® Pro II Process
Software for spectral data acquisition, graphical display, data storage, and data output in process control
- Contains all MultiSpec® Pro II Standard features
- Flexible setting of result values - includes mathematical parser for calculations of results
- Connection to Process Interfaces: OPC/DA, Profibus, and 4-20 mA analog outputs
MultiSpec® S²Q
Software for measurement of solar simulator qualification of cw and pulsed light source
- Recording time distribution of flash
- Integrated qualification of solar simulators
- Qualification according to IEC 60904-9
FTM-ProVis Professional
Easy-to-use application software to determine the thickness of thin, transparent films
- Analyzes thin films in the range of approximately 1-50 μm optical thickness
- Improved Fast-Fourier Transformation (FFT) algorithm
- Single and double layer analysis
- Real-time measurements