Spectroscopy provides quality control measurements via contactless, non-destructive measurements of optics and coatings.
To determine layer thicknesses on foils or optics, a typical method uses white-light interference to measure transparent single or double layers within a range of 0.1 to 150 μm. Sophisticated fitting algorithms enable calculation of the layer thickness down to the nanometer scale. Reliable, high sensitivity data acquisition systems guarantee minimum measurement times for fast reaction times and high sample throughput. Multi-channel systems allow measurements at numerous points, thus reducing the necessity for moving parts such as transverses.
Typical applications in the optical industry include:
- Color measurement
- Film-thickness evaluation
- Absorption (filter characteristics)